Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/03/2003
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Application #:
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09498242
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Filing Dt:
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02/03/2000
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Inventor:
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Bryon K. Hance
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Title:
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METHOD AND APPARATUS FOR INSPECTING WAFER DEFECTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE AMD PLACE, P.O. BOX 3453 |
| PAUL S. DRAKE |
| SUNNYVALE, CALIFORNIA 94088 |
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| TIMOTHY M. HONEYCUTT |
| P.O. BOX 1577 |
| CYPRESS, TX 77410-1577 |
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