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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
07/29/2003
Application #:
09501958
Filing Dt:
02/10/2000
Inventors:
Jeremy I. Martin, Nicholas J. Kepler, Larry L. Zhao
Title:
METHOD AND TEST STRUCTURE FOR CHARACTERIZING SIDEWALL DAMAGE IN A SEMICONDUCTOR DEVICE
Assignment: 1
Reel/Frame:
010616/0275Recorded: 02/10/2000Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/04/2000
Exec Dt:
02/04/2000
Exec Dt:
02/03/2000
Assignee:
5204 E. BEN WHITE BLVD.
AUSTIN, TEXAS 78741
Correspondent:
WILLIAMS, MORGAN & AMERSON, P.C.
J. MIKE AMERSON
7676 HILLMONT, SUITE 250
HOUSTON, TX 77040

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