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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/14/2003
Application #:
09810247
Filing Dt:
03/19/2001
Publication #:
Pub Dt:
11/29/2001
Inventors:
Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Kazunobu Miki, Yoshinori Deguchi
Title:
SEMICONDUCTOR DEVICE TEST PROBE HAVING IMPROVED TIP PORTION AND MANUFACTURING METHOD THEREOF
Assignment: 1
Reel/Frame:
011628/0671Recorded: 03/19/2001Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/21/2001
Exec Dt:
02/21/2001
Exec Dt:
02/20/2001
Exec Dt:
02/26/2001
Exec Dt:
02/23/2001
Assignee:
2-3, MARUNOUCHI 2-CHOME CHIYODA-KU
TOKYO 100-8310, JAPAN
Correspondent:
BURNS, DOANE ET AL
PLATON N. MANDROS
P.O. BOX 1404
ALEXANDRIA, VA 22313-1404

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