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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/28/2003
Application #:
09549115
Filing Dt:
04/13/2000
Inventor:
Tetsuo Ohara
Title:
METHOD OF AND APPARATUS FOR REAL-TIME CONTINUAL NANOMETER SCALE POSITION MEASUREMENT BY BEAM PROBING AS BY LASER BEAMS AND THE LIKE OF ATOMIC AND OTHER UNDULATING SURFACES SUCH AS GRATINGS OR THE LIKE RELATIVELY MOVING WITH RESPECT TO THE PROBING BEAMS
Assignment: 1
Reel/Frame:
010893/0556Recorded: 06/14/2000Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/10/2000
Assignee:
20 BANKSIDE DRIVE
BILLERICA, MASSACHUSETTS 01821
Correspondent:
RINES AND RINES
ROBERT H. RINES, ESQ.
81 NORTH STATE STREET
CONCORD, NH 03301

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