Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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11/25/2003
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Application #:
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09575635
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Filing Dt:
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05/22/2000
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Inventors:
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Tadashi Otaka, Kouichi Nagai
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Title:
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METHOD OF MEASURING LENGTH WITH SCANNING TYPE ELECTRON MICROSCOPE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| CHIYODA-KU |
| 6, KANDA SURUGADAI 4-CHOME |
| TOKYO 101-8010, JAPAN |
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| NAKAHARA-KU, KAWASAKI-SHI |
| 1-1, KAMIKODANAKA 4-CHOME |
| KANAGAWA, JAPAN 211-8 |
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| KENYON & KENYON |
| EDWARD W. GREASON |
| ONE BROADWAY |
| NY, NY 10004 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU |
| TOKYO, JAPAN 163-0722 |
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| WESTERMAN, HATTORI, DANIELS & ADRIAN, LL |
| 1250 CONNECTICUT AVENUE, NW |
| SUITE-700 |
| WASHINGTON, DC 20036-2657 |
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Assignment:
3
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 2-10-23 SHIN-YOKOHAMA, KOHOKU-KU |
| YOKOHAMA-SHI, KANAGAWA, JAPAN 222-0033 |
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| WESTERMAN, HATTORI, DANIELS & ADRIAN, LL |
| 1250 CONNECTICUT AVENUE, NW |
| SUITE-700 |
| WASHINGTON, DC 20036-2657 |
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