Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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12/16/2003
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Application #:
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09414388
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Filing Dt:
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10/07/1999
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Inventors:
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STEVEN W. MEEKS, RUSMIN KUDINAR
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Title:
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SYSTEM AND METHOD FOR SIMULTANEOUSLY MEASURING THIN FILM LAYER THICKNESS, REFLECTIVITY, ROUGHNESS, SURFACE PROFILE AND MAGNETIC PATTERN IN THIN FILM MAGNETIC DISKS AND SILICON WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SUITE 104D |
| 48890 MILMONT DRIVE |
| FREMONT, CALIFORNIA 94538 |
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| FENWICK & WEST LLP |
| JOHN T. MCNELIS |
| 2 PALO ALTO SQUARE |
| PALO ALTO, CA 94306 |
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Assignment:
2
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MERGER (SEE DOCUMENT FOR DETAILS).
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| 160 RIO ROBLES |
| SAN JOSE, CALIFORNIA 95134 |
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| RAMIN AGHEVLI |
| CAVEN & AGHEVLI LLC |
| 9249 S. BROADWAY, UNIT 200-201 |
| HIGHLANDS RANCH, CO 80129 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| RAMIN AGHEVLI |
| CAVEN & AGHEVLI LLC |
| 9249 S. BROADWAY, UNITE 200-201 |
| HIGHLANDS RANCH, CO 80129 |
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