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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
01/27/2004
Application #:
10111621
Filing Dt:
04/26/2002
Publication #:
Pub Dt:
11/21/2002
Inventor:
Hideo Takeuchi
Title:
DC TESTING APPARATUS AND SEMICONDUCTOR TESTING APPARATUS
Assignment: 1
Reel/Frame:
012945/0624Recorded: 04/26/2002Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/24/2002
Assignee:
32-1, ASAHI-CHO 1-CHOME
NERIMA-KU, TOKYO, JAPAN
Correspondent:
MURAMASU & ASSOCIATES
YASUO MURAMATSU
7700 IRVINE CENTER DRIVE, SUITE 225
IRVINE, CA 92618

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