Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/24/2004
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Application #:
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10306760
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Filing Dt:
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11/27/2002
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Publication #:
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Pub Dt:
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06/26/2003
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Inventor:
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Gaku Kamitani
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Title:
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CORRECTION METHOD OF MEASUREMENT ERRORS, QUALITY CHECKING METHOD FOR ELECTRONIC COMPONENTS, AND CHARACTERISTIC MEASURING SYSTEM OF ELECTRONIC COMPONENTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 26-10, TENJIN 2-CHOME, NAGAOKAKYO-SHI |
| KYOTO-FU, JAPAN 617-8555 |
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| OSTROLENK, FABER, GERB ET AL. |
| MARTIN PFEFFER |
| 1180 AVENUE OF THE AMERICAS |
| NEW YORK, NY 10036-8403 |
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