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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/18/2004
Application #:
09494637
Filing Dt:
01/31/2000
Inventor:
Pen-Guey Hsieh
Title:
USING NEW PATTERN FRACTURING RULES FOR OPTICAL PROXIMITY CORRECTION MASK-MAKING TO IMPROVE CRITICAL DIMENSION UNIFORMITY
Assignment: 1
Reel/Frame:
010581/0190Recorded: 01/31/2000Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
01/17/2000
Assignee:
SCIENCE-BASED INDUSTRIAL PARK
121 PARK AVE. 3
HSIN-CHU, TAIWAN R.O.C
Correspondent:
GEORGE O. SAILE
20 MCINTOSH DRIVE
POUGHKEEPSIE, NY 12603

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