Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/13/2004
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Application #:
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10305225
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Filing Dt:
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11/25/2002
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Inventors:
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Huade Walter Yao, Kurt Owen Taylor
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Title:
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TESTING SYSTEM AND METHOD OF OPERATION THEREFOR INCLUDING A TEST FIXTURE FOR ELECTRICAL TESTING OF SEMICONDUCTOR CHIPS ABOVE A THERMAL THRESHOLD TEMPERATURE OF AN INTERLAYER DIELECTRIC MATERIAL
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ONE AMD PLACE |
P.O. BOX 3453 |
SUNNYVALE, CALIFORNIA 94088-3453 |
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THE LAW OFFICES OF MIKIO ISHIMARU |
MIKIO ISHIMARU |
1110 SUNNYVALE-SARATOGA RD. |
SUITE A1 |
SUNNYVALE, CA 94087 |
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