Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/13/2004
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Application #:
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10176118
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Filing Dt:
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06/19/2002
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Inventor:
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Ron Rulkens
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Title:
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METHOD FOR IN-SITU FILM THICKNESS MEASUREMENT AND ITS USE FOR IN-SITU CONTROL OF DEPOSITED FILM THICKNESS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4000 NORTH FIRST STREET |
| SAN JOSE, CALIFORNIA 95134 |
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| DELIO & PETERSON, LLC |
| KELLY M. REYNOLDS |
| 121 WHITNEY AVENUE |
| NEW HAVEN, CT 06510-1241 |
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