Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/03/2004
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Application #:
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10440826
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Filing Dt:
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05/19/2003
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Inventors:
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Christopher F. Bevis, David E. Clapper
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Title:
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CRITICAL DIMENSION SCANNING ELECTRON MICROSCOPE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| LUEDEKA, NEELY & GRAHAM, P.C. |
| RICK BARNES |
| P.O. BOX 1871 |
| KNOXVILLE, TN 37901 |
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