Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/03/2004
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Application #:
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09648381
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Filing Dt:
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08/25/2000
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Inventors:
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Akella V. S. Satya, David L. Adler, Bin-Ming Benjamin Tsai, David J. Walker
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Title:
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MULTI-PIXEL METHODS AND APPARATUS FOR ANALYSIS OF DEFECT INFORMATION FROM TEST STRUCTURES ON SEMICONDUCTOR DEVICES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 160 RIO ROBLES |
| SAN JOSE, CALIFORNIA 95134 |
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| BEYER WEAVER & THOMAS LLP |
| MARY R. OLYNICK |
| P.O. BOX 130 |
| MOUNTAIN VIEW, CA 94042-0130 |
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