Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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08/31/2004
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Application #:
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10430271
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Filing Dt:
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05/07/2003
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Publication #:
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Pub Dt:
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05/27/2004
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Inventors:
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Hiroki Nishida, Yoshihiro Nagura
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Title:
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SEMICONDUCTOR TESTING DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO 100-6334, JAPAN |
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| BURNS, DOANE, SWECKER & MATHIS, L.L.P. |
| PLATON N. MANDROS |
| P.O. BOX 1404 |
| ALEXANDRIA, VA 22313-1404 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 1753, SHIMONUMABE, NAKAHARA-KU |
| KAWASAKI-SHI, KANAGAWA, JAPAN |
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| JAMES A. LABARRE |
| 1737 KING STREET |
| SUITE 210 |
| ALEXANDRIA, VA 22314 |
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Assignment:
3
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MERGER (SEE DOCUMENT FOR DETAILS).
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| 1753, SHIMONUMABE, NAKAHARA-KU |
| KAWASAKI-SHI, KANAGAWA, JAPAN |
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| JAMES A. LABARRE |
| 1737 KING STREET |
| SUITE 500 |
| ALEXANDRIA, VA 22314 |
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