Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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10/26/2004
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Application #:
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09865528
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Filing Dt:
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05/29/2001
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Publication #:
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Pub Dt:
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07/18/2002
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Inventor:
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Keizo Yamada
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Title:
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SEMICONDUCTOR DEVICE TEST METHOD AND SEMICONDUCTOR DEVICE TESTER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-1, SHIBA 5-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| MCGINN & GIBB, PLLC |
| SEAN M. MCGINN, ESQ. |
| 8321 OLD COURTHOUSE RD. |
| SUITE 200 |
| VIENNA, VA 22182-3817 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NISSEI SHINMIZONOKUCHI BLDG. 5F 3-5-7 |
| HISAMOTO, TAKATSU-KU |
| KAWASAKI KANAGAWA, JAPAN 213-0011 |
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| MCGINN & GIBB, PLLC |
| SEAN M. MCGINN |
| 8321 OLD COURTHOUSE ROAD, SUITE 200 |
| VIENNA, VA 22182-3817 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 75-1 HASUNUMA-CHO, ITABASHI-KU |
| TOKYO, JAPAN 174-8580 |
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| NEIL A. STEINBERG |
| 2665 MARINE WAY |
| SUITE 1150 |
| MOUNTAIN VIEW, CALIFORNIA 94043 |
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