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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
6809808
Issue Dt:
10/26/2004
Application #:
10103560
Filing Dt:
03/22/2002
Publication #:
20030179369
Pub Dt:
09/25/2003
Inventors:
Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Silviu Reinhorn, Ron Naftali et al
Title:
WAFER DEFECT DETECTION SYSTEM WITH TRAVELING LENS MULTI-BEAM SCANNER
Assignment: 1
Reel/Frame:
013109/0126Recorded: 09/20/2002Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
FELDMAN, HAIM
Exec Dt:
08/26/2002
ELYASAF, EMANUEL
Exec Dt:
08/15/2002
ELMALIACH, NISSIM
Exec Dt:
08/26/2002
NAFTALI, RON
Exec Dt:
08/24/2002
GOLBERG, BORIS
Exec Dt:
08/26/2002
REINHORN, SILVIU
Exec Dt:
09/01/2002
Assignee:
APPLIED MATERIALS, INC.
LEGAL AFFAIRS DEPARTMENT - M/S 2061
3050 BOWERS AVE.
SANTA CLARA, CALIFORNIA 95054
Correspondent:
APPLIED MATERIALS, INC.
LEGAL AFAIRS DEPARTMENT
P.O. BOX 450A
M/S 2061
SANTA CLARA, CA 95052
Assignment: 2
Reel/Frame:
014353/0864Recorded: 08/06/2003Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
APPLIED MATERIALS, INC.
Exec Dt:
08/04/2003
Assignee:
APPLIED MATERIALS ISRAEL, LTD.
9 OPPENHEIMER STREET
REHOVOT, 76705, ISRAEL
Correspondent:
SUGHRUE MION, PLLC
2100 PENNSYLVANIA AVENUE, N.W.
SUITE 800
WASHINGTON, DC 20037

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