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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
11/30/2004
Application #:
10082431
Filing Dt:
02/22/2002
Inventor:
Wei Zhang
Title:
INTEGRATED ELECTROMIGRATION LENGTH EFFECT TESTING METHOD AND APPARATUS
Assignment: 1
Reel/Frame:
012642/0519Recorded: 02/22/2002Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
02/22/2002
Assignee:
901 SAN ANTONIO ROAD
PALO ATLO, CALIFORNIA 94303
Correspondent:
SIERRA PATENT GROUP, LTD.
TIMOTHY A. BRISSON
P.O. BOX 6149
STATELINE, NV 89449

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