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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
6833717
Issue Dt:
12/21/2004
Application #:
10778982
Filing Dt:
02/12/2004
Inventors:
Shinichi Kurita, Emanuel Beer, Hunt T. Nguyen, Benjamin Johnston
Title:
ELECTRON BEAM TEST SYSTEM WITH INTEGRATED SUBSTRATE TRANSFER MODULE
Assignment: 1
Reel/Frame:
014996/0083Recorded: 02/12/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
KURITA, SHINICHI
Exec Dt:
02/10/2004
EMANUEL, BEER
Exec Dt:
02/10/2004
NGUYEN, HUNG T.
Exec Dt:
02/11/2004
JOHNSTON, BENJAMIN
Exec Dt:
02/10/2004
Assignee:
APPLIED MATERIALS INC.
P.O. BOX 450-A
SANTA CLARA, CALIFORNIA 95052
Correspondent:
APPLIED MATERIALS, INC.
PATENT COUNSEL
P.O. BOX 450-A
SANTA CLARA, CA 95052
Assignment: 2
Reel/Frame:
015257/0409Recorded: 10/19/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
KURITA, SHINICHI
Exec Dt:
09/28/2004
BEER, EMANUEL
Exec Dt:
09/27/2004
NGUYEN, HUNG T.
Exec Dt:
09/27/2004
JOHNSTON, BENJAMIN
Exec Dt:
09/27/2004
ABBOUD, FAYEZ E.
Exec Dt:
09/27/2004
Assignee:
APPLIED MATERIALS INC.
P.O. BOX 450-A
SANTA CLARA, CALIFORNIA 95052
Correspondent:
APPLIED MATERIALS, INC.
ROBERT W. MULCAHY
PATENT COUNSEL
P.O. BOX 450-A
SANTA CLARA, CA 95052

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