Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/01/2005
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Application #:
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10417257
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Filing Dt:
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04/17/2003
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Publication #:
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Pub Dt:
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03/11/2004
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Inventors:
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Stephen Roux, Todd J. Bednarek
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Title:
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RETICLE FOCUS MEASUREMENT SYSTEM USING MULTIPLE INTERFEROMETRIC BEAMS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 77 DANBURY ROAD |
| WILTON, CONNECTICUT 06897-0877 |
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| STERNE, KESSLER, GOLDSTEIN & FOX PLLC |
| 1100 NEW YORK AVENUE, N.W. |
| WASHINGTON, DC 20005 |
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