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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/15/2005
Application #:
10016943
Filing Dt:
12/13/2001
Inventor:
Pablo I. Rovira
Title:
OPTICAL METROLOGY SYSTEM WITH COMBINED INTERFEROMETER AND ELLIPSOMETER
Assignment: 1
Reel/Frame:
012387/0691Recorded: 12/13/2001Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/12/2001
Assignee:
1550 BUCKEYE DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SKJERVEN MORRILL MACPHERSON LLP
MICHAEL J. HALBERT
25 METRO DRIVE, SUITE 700
SAN JOSE, CA 95110

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