Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/01/2005
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Application #:
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10111500
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Filing Dt:
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04/24/2002
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Publication #:
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Pub Dt:
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10/24/2002
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Inventor:
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Miho Iwabuchi
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Title:
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Method for inspecting silicon wafer,method for manufacturing silicon wafer, method for fabricating semiconductor device, and silicon wafer
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| CHIYODA-KU |
| 4-2, MARUNOUCHI 1-CHOME |
| TOKYO, JAPAN |
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| RADER, FISHMAN & GRAUER, PLLC |
| DAVID K. BENSON |
| 1233 20TH STREET, N.W. |
| SUITE 501 |
| WASHINGTON, D.C. 20036 |
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