Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/03/2005
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Application #:
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10218035
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Filing Dt:
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08/14/2002
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Publication #:
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Pub Dt:
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03/13/2003
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Inventors:
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Osamu Nakamura, Mai Akiba
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Title:
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TEST ELEMENT GROUP, METHOD OF MANUFACTURING A TEST ELEMENT GROUP, METHOD OF TESTING A SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 398 HASE ATSUGI-SHI |
| KANAGAWA-KEN, JAPAN 243-0036 |
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| FISH & RICHARDSON P.C. |
| JOHN J. HAYDEN |
| 1425 K STREET, N.W. |
| 11TH FLOOR |
| WASHINGTON, D.C. 20005-3500 |
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