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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
05/03/2005
Application #:
10316722
Filing Dt:
12/11/2002
Publication #:
Pub Dt:
09/25/2003
Inventors:
Oliver Harnack, Jurina Wessels, William E. Ford, Akio Yasuda
Title:
METHOD FOR DEFECT AND CONDUCTIVITY ENGINEERING OF A CONDUCTING NANOSCALED STRUCTURE
Assignment: 1
Reel/Frame:
014095/0018Recorded: 05/23/2003Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/11/2002
Exec Dt:
12/11/2002
Exec Dt:
12/11/2002
Exec Dt:
01/08/2003
Assignee:
KEMPERPLATZ 1
D-10785 BERLIN, GERMANY
Correspondent:
FROMMER LAWRENCE & HAUG LLP
WILLIAM S. FROMMER
745 FIFTH AVE.
NEW YORK, NY 10151
Assignment: 2
Reel/Frame:
018047/0425Recorded: 07/13/2006Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
05/24/2006
Assignee:
HUGO-ECKENER-STR. 20
50829, KOLN, GERMANY
Correspondent:
WILLIAM S. FROMMER
FROMMER LAWRENCE & HAUG LLP
745 FIFTH AVENUE
NEW YORK, NY 10151

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