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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
06/07/2005
Application #:
10449761
Filing Dt:
05/30/2003
Publication #:
Pub Dt:
12/25/2003
Inventors:
Emilio Camerlenghi, Paolo Cappelletti, Tecla Ghilardi, Mauro Sali, Giorgio Servalli
Title:
TEST STRUCTURE FOR THE MEASUREMENT OF CONTACT TO GATE DISTANCE IN NON-VOLATILE MEMORY DEVICES AND CORRESPONDING TEST METHOD
Assignment: 1
Reel/Frame:
014457/0372Recorded: 09/02/2003Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/25/2003
Exec Dt:
07/25/2003
Exec Dt:
07/25/2003
Exec Dt:
08/05/2003
Exec Dt:
07/25/2003
Assignee:
VIA C. OLIVETTI, 2
20041 AGRATE BRIANZA (MI), ITALY
Correspondent:
ALLEN, DYER, DOPPELT, MILBRATH, ET AL
CHRISTOPHER F. REGAN, ESQ.
255 S. ORANGE AVENUE
P.O. BOX 3791
ORLANDO, FLORIDA 32802

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