Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/14/2005
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Application #:
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10399082
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Filing Dt:
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04/11/2003
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Publication #:
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Pub Dt:
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12/25/2003
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Inventor:
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Takahiro Yasui
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Title:
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MEMORY DEFECT REDRESS ANALYSIS TREATING METHOD, AND MEMORY TESTING APPARATUS PERFORMING THE METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 32-1, ASAHICHO 1-CHOME, NERIMA-KU |
| TOKYO, JAPAN |
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| GALLAGHER & LATHROP |
| DAVID N. LATHROP |
| 601 CALIFORNIA STREET, SUITE 1111 |
| SAN FRANCISCO, CA 94108-2805 |
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