Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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08/30/2005
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Application #:
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10652071
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Filing Dt:
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09/02/2003
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Publication #:
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Pub Dt:
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04/22/2004
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Inventors:
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Masahiro Horie, Hideki Hayashi, Fujikazu Kitamura, Kumiko Akashika
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Title:
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APPARATUS FOR MEASURING FILM THICKNESS FORMED ON OBJECT, APPARATUS AND METHOD OF MEASURING SPECTRAL REFLECTANCE OF OBJECT, AND APPARATUS AND METHOD OF INSPECTING FOREIGN MATERIAL ON OBJECT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1 TENJINKITAMACHI, TERANOUCHI-AGARU 4-CHOME |
| HORIKAWA-DORI, KAMIKYO-KU |
| KYOTO, JAPAN |
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| MCDERMOTT, WILL & EMERY |
| STEPHEN A. BECKER |
| 600 13TH STREET, N.W. |
| WASHINGTON, D.C. 20005-3096 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| TENJINKITA-MACHI 1-1, TERANOUCHI-AGARU |
| 4-CHOME, HORIKAWA-DORI, KAMIGYO-KU |
| KYOTO, JAPAN |
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| MCDERMOTT WILL & EMERY LLP |
| 500 NORTH CAPITOL STREET, N.W. |
| WASHINGTON, DC 20001 |
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