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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
10/04/2005
Application #:
10755750
Filing Dt:
01/12/2004
Publication #:
Pub Dt:
07/22/2004
Inventors:
Joonhyung Kwon, Young Seok Kim, Sang-il Park
Title:
SCANNING PROBE MICROSCOPE WITH IMPROVED PROBE HEAD MOUNT
Assignment: 1
Reel/Frame:
014889/0174Recorded: 01/12/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/10/2004
Exec Dt:
01/10/2004
Exec Dt:
01/10/2004
Assignee:
INDUSPIA 5F, SANG-DAEWON-DONG 517-13
SUNGNAM 462-120, KOREA, REPUBLIC OF
Correspondent:
SILICON VALLEY PATENT GROUP LLP
OMKAR K. SURYADEVARA
2350 MISSION COLLEGE BOULEVARD
SUITE 360
SANTA CLARA, CA 95054
Assignment: 2
Reel/Frame:
019550/0027Recorded: 07/12/2007Pages: 6
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/23/2007
Assignee:
KANC 4F, IUI-DONG 906-10
SUWON, KOREA, REPUBLIC OF 443-766
Correspondent:
PATTERSON & SHERIDAN LLP
3040 POST OAK BLVD.
SUITE 1500
HOUSTON, TX 77056

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