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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/11/2005
Application #:
10472312
Filing Dt:
02/17/2004
Publication #:
Pub Dt:
07/29/2004
Inventors:
Tetsuo Abe, Kouki Okawauchi, Tadashi Hattori, Hironori Fujita, Minoru Takeda, Yuichi Ak et al
Title:
INSPECTION DEVICE USING SCANNING ELECTRON MICROSCOPE
Assignment: 1
Reel/Frame:
014978/0158Recorded: 02/17/2004Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/01/2003
Exec Dt:
09/16/2003
Exec Dt:
09/17/2003
Exec Dt:
09/17/2003
Exec Dt:
09/03/2003
Exec Dt:
09/16/2003
Exec Dt:
09/30/2003
Exec Dt:
10/06/2003
Exec Dt:
09/30/2003
Exec Dt:
09/30/2003
Assignees:
7-35 KITASHINAGAWA, 6-CHOME
SHINAGAWA-KU, TOKYO, JAPAN
1-2, MUSASHINO, 3-CHOME
AKISHIMA, TOKYO 196-8558, JAPAN
Correspondent:
HOLLAND & KNIGHT LLP
LEWIS T. STEADMAN
131 SOUTH DEARBORN STREET, 30TH FLOOR
CHICAGO, IL 60603

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