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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
6955929
Issue Dt:
10/18/2005
Application #:
10709236
Filing Dt:
04/23/2004
Publication #:
20040214356
Pub Dt:
10/28/2004
Inventors:
Cheng-Tung Huang, Sheng-Hao Lin, Nien-Chung Li, Yi-Cheng Sheng, Chien-Chieh Huang
Title:
METHOD OF MEASURING A GATE CHANNEL LENGTH OF A METAL-OXIDE SEMICONDUCTOR TRANSISTOR
Assignment: 1
Reel/Frame:
014525/0410Recorded: 04/23/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
HUANG, CHENG-TUNG
Exec Dt:
04/21/2004
LIN, SHENG-HAO
Exec Dt:
04/21/2004
LI, NIEN-CHUNG
Exec Dt:
04/21/2004
SHENG, YI-CHENG
Exec Dt:
04/21/2004
Assignee:
UNITED MICROELECTRONICS CORP.
NO.3, LI-HSIN ROAD 2, SCIENCE-BASED INDUSTRIAL PARK
HSIN-CHU CITY, TAIWAN
Correspondent:
NAIPO (NORTH AMERICA INTERNATIONAL PATEN
P.O. BOX 506
MERRIFIELD, VA 22116
Assignment: 2
Reel/Frame:
017468/0752Recorded: 01/17/2006Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
HUANG, CHENG-TUNG
Exec Dt:
12/13/2005
LIN, SHENG-HAO
Exec Dt:
12/13/2005
HUANG, CHIEN-CHIEH
Exec Dt:
12/13/2005
LI, NIEN-CHUNG
Exec Dt:
12/13/2005
SHENG, YI-CHENG
Exec Dt:
12/13/2005
Assignee:
UNITED MICROELECTRONICS CORP.
NO. 3, LI-HSIN ROAD 2, SCIENCE-BASED PARK
HSIN-CHU CITY, TAIWAN R.O.C.
Correspondent:
NORTH AMERICA INTELLECTUAL PROPERTY CORP
P.O. BOX 506
MERRIFIELD, VA 22116

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