Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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03/28/2006
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Application #:
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10459598
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Filing Dt:
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06/12/2003
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Publication #:
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Pub Dt:
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04/07/2005
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Inventors:
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Masatoshi Kanamaru, Takanori Aono, Tatsuya Nagata, Kenji Kawakami, Hideyuki Aoki
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Title:
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Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probe
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6, KANDA SURUGADAI 4-CHOME |
| CHIYODA-KU |
| TOKYO, JAPAN |
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| ANTONELLI, TERRY, STOUT ET AL. |
| WILLIAM I. SOLOMON |
| 1300 NORTH SEVENTEENTH STREET |
| SUITE 1800 |
| ARLINGTON, VA 22209 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO, JAPAN |
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| ANTONELLI, TERRY, STOUT & KRAUS |
| MELVIN KRAUS |
| 1300 N. SEVENTEENTH ST., SUITE 1800 |
| ARLINGTON, VA 22209 |
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