Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/11/2006
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Application #:
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10791725
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Filing Dt:
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03/04/2004
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Publication #:
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Pub Dt:
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12/02/2004
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Inventor:
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Daisuke Maruyama
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Title:
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INTEGRATED CIRCUIT TESTING METHOD, PROGRAM, STORING MEDIUM, AND APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU |
| KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN |
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| FOX KINTNER PLOTKIN ET AL. |
| CHARLES M. MARMELSTEIN |
| 1050 CONNECTICUT AVENUE, N.W., SUITE 400 |
| WASHINGTON, DC 20036-5339 |
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