Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
05/16/2006
|
Application #:
|
10624189
|
Filing Dt:
|
07/22/2003
|
|
Publication #:
|
|
Pub Dt:
|
02/17/2005
| | | | |
|
Inventors:
|
Giuseppe Coppola, Pietro Ferraro, Mario Iodice, Sergio De Nicola
|
|
Title:
|
INTERFEROMETRIC SYSTEM FOR THE SIMULTANEOUS MEASUREMENT OF THE INDEX OF REFRACTION AND OF THE THICKNESS OF TRANSPARENT MATERIALS, AND RELATED PROCEDURE
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 19, VIA DEI TAURINI |
| 00185 ROMA, ITALY |
|
|
|
|
| HARRISON & EGBERT |
| ANDREW W. CHU |
| 412 MAIN STREET, 7TH FLOOR |
| HOUSTON, TX 77002 |
|
|
Search Results as of:
05/14/2024 11:46 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
