Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/13/2006
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Application #:
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10141267
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Filing Dt:
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05/08/2002
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Publication #:
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Pub Dt:
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04/17/2003
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Inventors:
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David Y. Wang, Lawrence Rotter, Jeffrey T. Fanton, Jeffrey E. McAninch
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Title:
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MEASUREMENT SYSTEM WITH SEPARATE OPTIMIZED BEAM PATHS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1250 RELIANCE WAY |
| FREMONT, CALIFORNIA 94539 |
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| STALLMAN & POLLOCK LLP |
| ATTN: MICHAEL A. STALLMAN |
| 121 SPEAR STREET, SUITE 290 |
| SAN FRANCISCO, C.A. 94105 |
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