Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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06/13/2006
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Application #:
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10689314
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Filing Dt:
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10/20/2003
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Publication #:
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Pub Dt:
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07/08/2004
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Inventors:
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David Berman, Alex Dikopoltsev, Dileep Agnihotri
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Title:
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X-RAY REFLECTOMETRY OF THIN FILM LAYERS WITH ENHANCED ACCURACY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 103 |
| MIGDAL HAEMEK, ISRAEL 33100 |
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| AMSTER, ROTHSTEIN & EBENSTEIN |
| MICHAEL J. BERGER |
| 90 PARK AVENUE |
| NEW YORK, NY 10016 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 103 |
| MIGDAL HAEMEK, ISRAEL 23100 |
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| D. KLIGLER I.P. SERVICES LTD |
| P.O. BOX 33111 |
| TEL AVIV, 61330 ISRAEL |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 103 |
| MIGDAL HAEMEK, ISRAEL 23100 |
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| AMSTER, ROTHSTEIN & EBENSTEIN LLP |
| ATTN: MICHAEL J. BERGER, ESQ. |
| 90 PARK AVENUE |
| NEW YORK, NEW YORK 10016 |
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Assignment:
4
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 6 HAMECHKAR STREET |
| P.O. BOX 103 |
| MIGDAL HAEMEK, ISRAEL 2306990 |
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| KLIGLER & ASSOCIATES PATENT ATTORNEYS LTD. |
| P.O. BOX 57651 |
| TEL AVIV, 6157601 ISRAEL |
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