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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
07/25/2006
Application #:
10870017
Filing Dt:
06/17/2004
Publication #:
Pub Dt:
12/23/2004
Inventors:
Katsuhiko Satou, Chikaomi Mori, Masanari Nakashima
Title:
PROBE CARD FOR EXAMINING SEMICONDUCTOR DEVICES ON SEMICONDUCTOR WAFERS
Assignment: 1
Reel/Frame:
014814/0830Recorded: 07/06/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/10/2004
Exec Dt:
06/10/2004
Exec Dt:
06/10/2004
Assignee:
2-5-13 NISHINAGASU-CHO, AMAGASAKI-CITY
HYOGO, JAPAN 660-0805
Correspondent:
JOHN F. HOFFMAN
BAKER & DANIELS
111 EAST WAYNE ST., SUITE 800
FORT WAYNE, IN 46802

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