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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
08/08/2006
Application #:
10655892
Filing Dt:
09/04/2003
Publication #:
Pub Dt:
03/10/2005
Inventor:
Joseph Weiyeh Ku
Title:
METHOD AND APPARATUS FOR THERMALLY ASSISTED TESTING OF INTEGRATED CIRCUITS
Assignment: 1
Reel/Frame:
014479/0728Recorded: 09/04/2003Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
08/19/2003
Assignee:
20555 SH 249
HOUSTON, TEXAS 77070
Correspondent:
HEWLETT-PACKARD COMPANY
VAUGHN W. NORTH
P.O. BOX 272400
FORT COLLINS, COLORAOD 80527-2400

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