Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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08/08/2006
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Application #:
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10986271
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Filing Dt:
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11/12/2004
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Publication #:
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Pub Dt:
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06/02/2005
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Inventors:
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Kozo Hoshino, Hiroshi Iwata, Akihide Shibata
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Title:
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METHOD OF EVALUATING CHARACTERISTICS OF SEMICONDUCTOR MEMORY ELEMENT, AND METHOD OF EXTRACTING MODEL PARAMETER OF SEMICONDUCTOR MEMORY ELEMENT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 22-22, NAGAIKE-CHO, ABENO-KU |
| OSAKA-SHI, OSAKA 545-8522, JAPAN |
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| CHARLES GORENSTEIN |
| BIRCH, STEWART, KOLASCH & BIRCH, LLP |
| 8110 GATEHOUSE RD |
| SUITE 100 EAST, P.O. BOX 100 EAST |
| FALLS CHURCH, VA 22040-0747 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ARPAD UT 48-50, 1/5 |
| BUDAPEST, HUNGARY 1042 |
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| PAUL S. HUNTER |
| FOLEY & LARDNER LLP |
| 150 E GILMAN STREET |
| MADISON, WI 53703 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2711 CENTERVILLE RD |
| SUITE 400 |
| WILMINGTON, DELAWARE 19808 |
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| PAUL S. HUNTER |
| FOLEY & LARDNER LLP |
| 150 E GILMAN STREET |
| MADISON, WI 53703 |
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