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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
08/15/2006
Application #:
10723585
Filing Dt:
11/26/2003
Inventor:
Victor C. Dardzinski
Title:
METHOD AND APPARATUS FOR INSPECTING A SEMICONDUCTOR WAFER
Assignment: 1
Reel/Frame:
015275/0925Recorded: 04/29/2004Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/25/2004
Assignee:
47 MANNING ROAD
BILLERICA, MASSACHUSETTS 01821
Correspondent:
KRIEGSMAN & KRIEGSMAN
665 FRANKLIN STREET
FRAMINGHAM, MA 01702
Assignment: 2
Reel/Frame:
015746/0731Recorded: 02/18/2005Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
09/27/2004
Assignee:
160 RIO ROBLES
SAN JOSE, CALIFORNIA 95134
Correspondent:
DAFFER MCDANIEL, LLP
ANN MARIE MEWHERTER
P.O. BOX 684908
AUSTIN, TX 78768-4908

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