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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
7110917
Issue Dt:
09/19/2006
Application #:
10986781
Filing Dt:
11/15/2004
Publication #:
20050154562
Pub Dt:
07/14/2005
Inventors:
Nekka Matsuura, Hisashi Shoji, Satoshi Ouchi, Yasushi Nakazato, Katsuaki Miyawaki et al
Title:
ABNORMALITY DETERMINING METHOD, AND ABNORMALITY DETERMINING APPARATUS AND IMAGE FORMING APPARATUS USING SAME
Assignment: 1
Reel/Frame:
016406/0445Recorded: 03/28/2005Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
MATSUURA, NEKKA
Exec Dt:
12/01/2004
SHOJI, HISASHI
Exec Dt:
12/02/2004
OUCHI, SATOSHI
Exec Dt:
12/06/2004
MIYAWAKI, KATSUAKI
Exec Dt:
12/06/2004
SATOH, OSAMU
Exec Dt:
12/02/2004
YAMADA, MASAAKI
Exec Dt:
12/03/2004
HIRAI, SHUJI
Exec Dt:
12/02/2004
NAKAGAWA, YOSHINORI
Exec Dt:
12/06/2004
NAKAZATO, YASUSHI
Exec Dt:
12/03/2004
TAKAHASHI, TOMOKO
Exec Dt:
12/06/2004
SETO, TAKASHI
Exec Dt:
12/06/2004
HOSHINO, SEIJI
Exec Dt:
12/06/2004
Assignee:
RICOH COMPANY, LTD.
3-6, 1-CHOME NAKAMAGOME
OTA-KU
TOKYO, JAPAN
Correspondent:
OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST
1940 DUKE STREET
ALEXANDRIA, VA 22314

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