Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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09/26/2006
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Application #:
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09716077
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Filing Dt:
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11/17/2000
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Inventors:
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Kenji Obara, Yuji Takagi, Ryo Nakagaki, Yasuhiro Ozawa, Toshiei Kurosaki, Seiji Isogai
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Title:
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DEFECT IMAGE CLASSIFYING METHOD AND APPARATUS AND A SEMICONDUCTOR DEVICE MANUFACTURING PROCESS BASED ON THE METHOD AND APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU |
TOKYO, JAPAN |
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TOWNSEND AND TOWNSEND AND CREW LLP |
PAUL A. DURDIK |
TWO EMBARCADERO CENTER, 8TH FLOOR |
SAN FRANCISCO, CA 94111-3834 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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5-1, MARUNOUCHI 1-CHOME, CHIYODA-KU |
TOKYO, JAPAN 100-8 |
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TOWNSEND AND TOWNSEND AND CREW LLP |
GEORGE B. F. YEE |
TWO EMBARCADERO CENTER, 8TH FLOOR |
SAN FRANCISCO, CA 94111-3834 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU |
TOKYO, JAPAN |
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TOWNSEND AND TOWNSEND AND CREW LLP |
GEORGE B. F. YEE |
TWO EMBARCADERO CENTER, 8TH FLOOR |
SAN FRANCISCO, CA 94111-3834 |
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Assignment:
4
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU |
TOKYO, JAPAN |
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TOWNSEND AND TOWNSEND AND CREW LLP |
GEORGE B. F. YEE |
TWO EMBARCADERO CENTER, EIGHTH FLOOR |
SAN FRANCISCO, CA 94111-3834 |
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