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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
09/26/2006
Application #:
10109869
Filing Dt:
04/01/2002
Publication #:
Pub Dt:
10/17/2002
Inventor:
Hiroyuki Onishi
Title:
PATTERN INSPECTING APPARATUS AND METHOD
Assignment: 1
Reel/Frame:
012766/0432Recorded: 04/01/2002Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/25/2002
Assignee:
HORIKAWA-DORI, KAMIKYO-KU
1-1 TENJINKITAMACHI TERANOUCHI-AGARU 4-CHOME
KYOTO 602-8585, JAPAN
Correspondent:
MCDERMOTT, WILL & EMERY
STEPHEN A. BECKER
600 13TH STREET, NW.
WASHINGTON, DC 20005
Assignment: 2
Reel/Frame:
035071/0249Recorded: 02/24/2015Pages: 21
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
10/01/2014
Assignee:
TENJINKITA-MACHI 1-1, TERANOUCHI-AGARU
4-CHOME, HORIKAWA-DORI, KAMIGYO-KU
KYOTO, JAPAN
Correspondent:
MCDERMOTT WILL & EMERY LLP
500 NORTH CAPITOL STREET, N.W.
WASHINGTON, DC 20001

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