Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/03/2006
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Application #:
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10128142
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Filing Dt:
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04/23/2002
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Publication #:
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Pub Dt:
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12/19/2002
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Inventor:
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Nobuhito Toyama
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Title:
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METHOD OF EVALUATING THE EXPOSURE PROPERTY OF DATA TO WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1 ICHIGAYA-KAGACHO 1-CHOME |
| SHINJUKU-KU, TOKYO 162-8001, JAPAN |
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| FLYNN, THIEL, BOUTELL & TANIS |
| DALE H. THIEL |
| 2026 RAMBLING RD. |
| KALAMAZOO, MI 49008-1699 |
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