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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
7129727
Issue Dt:
10/31/2006
Application #:
11258041
Filing Dt:
10/26/2005
Publication #:
20060087330
Pub Dt:
04/27/2006
Inventors:
Tsutomu Saito, Osamu Yamada, Eiichi Hazaki, Yasuhiko Nara, Hirofumi Sato, Yoshikazu Inada et al
Title:
DEFECT INSPECTING APPARATUS
Assignment: 1
Reel/Frame:
017147/0603Recorded: 10/26/2005Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
SAITO, TSUTOMU
Exec Dt:
09/29/2005
YAMADA, OSAMU
Exec Dt:
09/30/2005
HAZAKI, EIICHI
Exec Dt:
10/12/2005
NARA, YASUHIKO
Exec Dt:
09/29/2005
SATO, HIROFUMI
Exec Dt:
09/29/2005
INADA, YOSHIKAZU
Exec Dt:
09/29/2005
NUMATA, YOSHINORI
Exec Dt:
09/30/2005
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHINBASHI 1-CHOME
MINATO-KU
TOKYO, JAPAN
Correspondent:
MCDERMOTT WILL & EMERY LLP
600 13TH STREET, N.W.
WASHINGTON, D.C. 20005-3096
Assignment: 2
Reel/Frame:
052259/0227Recorded: 03/30/2020Pages: 68
Conveyance:
CHANGE OF NAME AND ADDRESS
Assignor:
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/12/2020
Assignee:
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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