Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/06/2007
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Application #:
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10039290
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Filing Dt:
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01/04/2002
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Publication #:
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Pub Dt:
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09/12/2002
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Inventors:
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Ali Shakouri, Peyman Milanfar, James Christofferson, Kenneth Pedrotti
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Title:
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SUBMICRON THERMAL IMAGING METHOD AND ENHANCED RESOLUTION (SUPER-RESOLVED) AC-COUPLED IMAGING FOR THERMAL INSPECTION OF INTEGRATED CIRCUITS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 12TH FLOOR |
| 1111 FRANKLIN STREET |
| OAKLAND, CALIFORNIA 94607 |
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| O'BANION & RICHEY LLP |
| JOHN P. O'BANION |
| 400 CAPITOL MALL |
| SUITE 1550 |
| SACRAMENTO, CA 95814 |
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