Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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02/13/2007
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Application #:
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10819673
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Filing Dt:
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04/07/2004
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Publication #:
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Pub Dt:
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10/13/2005
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Inventor:
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Daniel P. Cram
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Title:
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CONTACT SYSTEM FOR WAFER LEVEL TESTING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8000 S. FEDERAL WAY |
| BOISE, IDAHO 83707 |
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| WONG CABELLO LUTSCH RUTHERFORD ET AL |
| TERRIL G. LEWIS |
| 20333 TOMBALL PKWY., SUITE 600 |
| HOUSTON, TEXAS 77070 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8000 S. FEDERAL WAY |
| BOISE, IDAHO 83707 |
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| TERRIL G. LEWIS |
| 20333 SH 249 SUITE 600 |
| HOUSTON, TX 77070 |
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