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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/06/2007
Application #:
10787772
Filing Dt:
02/27/2004
Publication #:
Pub Dt:
12/16/2004
Inventors:
Yun-Jung Jee, Sun-Yong Choi, Chung-Sam Jun, Kwan-Woo Ryu
Title:
METHOD FOR MONITORING A DENSITY PROFILE OF IMPURITIES
Assignment: 1
Reel/Frame:
015666/0274Recorded: 08/10/2004Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/15/2004
Exec Dt:
06/01/2004
Exec Dt:
06/15/2004
Exec Dt:
07/16/2004
Assignee:
416 MAETAN-DONG, YEONGTONG-GU
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Correspondent:
LEE & STERBA, P.C.
EUGENE M. LEE
1101 WILSON BOULEVARD, SUITE 2000
ARLINGTON, VA 22209

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