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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
03/20/2007
Application #:
10498398
Filing Dt:
01/04/2005
Publication #:
Pub Dt:
09/22/2005
Inventors:
Hiroyuki Takahashi, Hideo Inaba, Syouzou Uchida
Title:
SEMICONDUCTOR STORAGE DEVICE, TEST METHOD THEREFOR, AND TEST CIRCUIT THEREFOR
Assignment: 1
Reel/Frame:
016111/0926Recorded: 01/03/2005Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/16/2004
Exec Dt:
07/16/2004
Exec Dt:
07/16/2004
Assignee:
1753 SHIMONUMABE, NAKAHARA-KU
KAWASAKI-SHI, KANAGAWA 211-8668, JAPAN
Correspondent:
PATENT GROUP
CHOATE, HALL & STEWART
EXCHANGE PLACE, 53 STATE STREET
BOSTON, MA 02109-2804
Assignment: 2
Reel/Frame:
025525/0145Recorded: 12/22/2010Pages: 9
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/01/2010
Assignee:
1753 SHIMONUMABE, NAKAHARA-KU,
KAWASAKI-SHI, KANAGAWA, JAPAN 211-8668
Correspondent:
SUGHRUE MION, PLLC
2100 PENNSYLVANIA AVENUE, N.W.
SUITE 800
WASHINGTON, DC 20037

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