Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/27/2007
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Application #:
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10484001
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Filing Dt:
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01/09/2004
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Publication #:
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Pub Dt:
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06/02/2005
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Inventors:
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Katsushi Akita, Masashi Yamashita, Makoto Kiyama
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Title:
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METHOD FOR MEASURING WITHSTAND VOLTAGE OF SEMICONDUCTOR EPITAXIAL WAFER AND SEMICONDUCTOR EPITAXIAL WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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5-33, KITAHAMA 4-CHOME, |
CHUO-KU, OSAKA-SHI, JAPAN 541-0041 |
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JUDGE PATENT FIRM |
RIVIERE SHUKUGAWA 3RD FL. |
3-1 WAKAMATSU-CHO |
NISHINOMIYA-SHI, HYOGO, JAPAN 662-0035 |
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