Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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07/03/2007
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Application #:
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10477782
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Filing Dt:
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11/12/2003
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Publication #:
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Pub Dt:
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07/29/2004
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Inventor:
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Tomoyuki Yamane
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Title:
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SEMICONDUCTOR MEMORY TEST APPARATUS AND METHOD FOR ADDRESS GENERATION FOR DEFECT ANALYSIS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-32, ASAHI-CHO 1-CHOME, NERIMA-KU |
TOKYO, 179-0071, JAPAN |
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MURAMATSU & ASSOCIATES |
YASUO MURAMATSU |
7700 IRVINE CENTER DRIVE |
IRVINE, CA 92618 |
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Assignment:
2
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1-6-2, MARUNOUCHI, CHIYODA-KU |
TOKYO, JAPAN 100-0005 |
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ADVANTEST C/O MURABITO HAO & BARNES LLP |
TWO NORTH MARKET STREET |
THIRD FLOOR |
SAN JOSE, CA 95113 |
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