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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
7241987
Issue Dt:
07/10/2007
Application #:
11196104
Filing Dt:
08/03/2005
Publication #:
20060043276
Pub Dt:
03/02/2006
Inventors:
Yuika Saito, Takashi Nurakami, Satoshi Kawata, Yasushi Inoue, Kazuhito Tsukagoshi et al
Title:
PROBE FOR NEAR-FIELD MICROSCOPE, THE METHOD FOR MANUFACTURING THE PROBE AND SCANNING PROBE MICROSCOPE USING THE PROBE
Assignment: 1
Reel/Frame:
017103/0412Recorded: 10/20/2005Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
SAITO, YUIKA
Exec Dt:
10/14/2005
MURAKAMI, TAKASHI
Exec Dt:
10/14/2005
KAWATA, SATOSHI
Exec Dt:
10/14/2005
INOUE, YASUSHI
Exec Dt:
10/14/2005
TSUKAGOSHI, KAZUHITO
Exec Dt:
10/14/2005
IYOKI, MASATO
Exec Dt:
10/14/2005
Assignees:
RIKEN
2-1, HIROSAWA, WAKO-SHI
SAITAMA, JAPAN
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI
CHIBA, JAPAN
Correspondent:
BRUCE L. ADAMS
ADAMS & WILKS
17 BATTERY PLACE - SUITE 1231
NEW YORK, NEW YORK 10004
Assignment: 2
Reel/Frame:
033817/0078Recorded: 09/25/2014Pages: 22
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
SII NANOTECHNOLOGY INC.
Exec Dt:
01/01/2013
Assignee:
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME
TOKYO, JAPAN 105-0003
Correspondent:
ADAMS & WILKS
17 BATTERY PLACE
SUITE 1343
NEW YORK, NY 10004

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